Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Login
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
Article Information

Comparative Analysis of Neural Network Techniques Vs Statistical Methods in Capacity Planning
Vasudevan, N.; Parthasarathy, G.C.
Software Engineering Research, Management & Applications, 2007. SERA 2007. 5th ACIS International Conference on
Volume , Issue , 20-22 Aug. 2007 Page(s):799 - 806
Digital Object Identifier   10.1109/SERA.2007.66
Summary:Capacity planning is a technique which can be used to predict the computing resource needs of an organization for the future after studying current usage patterns. This is of special import for adaptive enterprises, given the large infrastructure and large number of users. Determining resource needs beforehand can be very beneficial because it is a proactive approach and helps prevent resource crunches and service level violations. Accuracy of the predicted values, however, depends upon the methods used for the forecast and also upon the accuracy of the historical data. Historical data in the capacity planning sense is system performance data. Most of the approaches used for such a prediction make use of statistical methods or are based on queuing theory. This paper compares the traditional statistical based methods with a method based on neural networks. The training set for the neural network consists of historical values of a metric (for example CPU utilization percentage) for which the prediction is to be done. The advantages of this method over other methods have also been discussed. From the predicted information, we illustrate how capacity planning is done.

» View citation and abstract

IEEE Members

Log in by entering your IEEE Web Account Username and Password.

IEEE Communications Society members: If you subscribe to the IEEE Electronic Periodicals Package or IEEE Electronic Periodicals Package Plus, you must access your subscription at www.comsoc.org.

Users at Subscribing Institutions

Check with your librarian, information professional, or system manager to determine if you need to log in. Please complete the online Technical Support Form if you need assistance.

Already Purchased This Article?

Select the Purchase History link to access the document. You will have 5 Days after purchase to access the Full Text PDF. Please complete the online Technical Support Form if you need assistance.

Guests

• Search and access Abstract records free of charge
Register for table of contents alerts
• Purchase Full Text PDF documents

» Learn more about subscription options or how to become an IEEE Member.

You are not logged in.
LOGIN
Username
Password
GO
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Learn more about IEEE Subscriptions
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved