Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Login
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
Article Information

The Effectiveness of Lloyd-Type Methods for the k-Means Problem
Rafail Ostrovsky; Yuval Rabani; Leonard J. Schulman; Chaitanya Swamy
Foundations of Computer Science, 2006. FOCS apos;06. 47th Annual IEEE Symposium on
Volume , Issue , Oct. 2006 Page(s):165 - 176
Digital Object Identifier   10.1109/FOCS.2006.75
Summary:We investigate variants of Lloyd's heuristic for clustering high dimensional data in an attempt to explain its popularity (a half century after its introduction) among practitioners, and in order to suggest improvements in its application. We propose and justify a clusterability criterion for data sets. We present variants of Lloyd's heuristic that quickly lead to provably near-optimal clustering solutions when applied to well-clusterable instances. This is the first performance guarantee for a variant of Lloyd's heuristic. The provision of a guarantee on output quality does not come at the expense of speed: some of our algorithms are candidates for being faster in practice than currently used variants of Lloyd's method. In addition, our other algorithms are faster on well-clusterable instances than recently proposed approximation algorithms, while maintaining similar guarantees on clustering quality. Our main algorithmic contribution is a novel probabilistic seeding process for the starting configuration of a Lloyd-type iteration

» View citation and abstract

IEEE Members

Log in by entering your IEEE Web Account Username and Password.

IEEE Communications Society members: If you subscribe to the IEEE Electronic Periodicals Package or IEEE Electronic Periodicals Package Plus, you must access your subscription at www.comsoc.org.

Users at Subscribing Institutions

Check with your librarian, information professional, or system manager to determine if you need to log in. Please complete the online Technical Support Form if you need assistance.

Already Purchased This Article?

Select the Purchase History link to access the document. You will have 5 Days after purchase to access the Full Text PDF. Please complete the online Technical Support Form if you need assistance.

Guests

• Search and access Abstract records free of charge
Register for table of contents alerts
• Purchase Full Text PDF documents

» Learn more about subscription options or how to become an IEEE Member.

You are not logged in.
LOGIN
Username
Password
GO
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Learn more about IEEE Subscriptions
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved