Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Login
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
Article Information

Opaque document imaging: building images of inaccessible texts
Yun Lin; Seales, W.B.
Computer Vision, 2005. ICCV 2005. Tenth IEEE International Conference on
Volume 1, Issue , 17-21 Oct. 2005 Page(s): 662 - 669 Vol. 1
Digital Object Identifier   10.1109/ICCV.2005.182
Summary: This paper introduces a method for building a readable image of an opaque, rolled or folded text from a volumetric, penetrating scan. The problem is framed by localizing, constructing, and manipulating an image induced by a surface embedded in a 3D voxel space. There are two central contributions that lead to the demonstrated results. First is an energy-based texture formation algorithm, which is a function of voxel intensities and the geometry of the embedded surface. Second is a regularization algorithm based on a constrained mapping of the embedded surface to a regularized image plane. The mapping preserves angles and lengths, which minimizes the distortion of text in the image. The experimental results show readable images derived from custom, high resolution (X-ray-based) CT scans of rolled papyrus and ink samples. These methods are significant for scholars seeking to study inaccessible texts, and may lead to viable techniques for scanning everyday opaque objects (books) without opening them.

» View citation and abstract

IEEE Members

Log in by entering your IEEE Web Account Username and Password.

IEEE Communications Society members: If you subscribe to the IEEE Electronic Periodicals Package or IEEE Electronic Periodicals Package Plus, you must access your subscription at www.comsoc.org.

Users at Subscribing Institutions

Check with your librarian, information professional, or system manager to determine if you need to log in. Please complete the online Technical Support Form if you need assistance.

Already Purchased This Article?

Select the Purchase History link to access the document. You will have 5 Days after purchase to access the Full Text PDF. Please complete the online Technical Support Form if you need assistance.

Guests

• Search and access Abstract records free of charge
Register for table of contents alerts
• Purchase Full Text PDF documents

» Learn more about subscription options or how to become an IEEE Member.

You are not logged in.
LOGIN
Username
Password
GO
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Learn more about IEEE Subscriptions
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved