Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Login
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
Article Information

An improved error concealment algorithm for intra-frames in H.264/AVC
Nasiopoulos, P.; Coria-Mendozal, L.; Mansour, H.; Golikeri, A.
Circuits and Systems, 2005. ISCAS 2005. IEEE International Symposium on
Volume , Issue , 23-26 May 2005 Page(s): 320 - 323 Vol. 1
Digital Object Identifier   10.1109/ISCAS.2005.1464589
Summary: The highly error-prone nature of wireless environments and limited computational power of mobile devices necessitates the implementation of robust yet simple error concealment in H.264/AVC. We propose a new and effective error concealment algorithm for intra-coded frames that utilizes the temporal redundancy in a wireless video bitstream. The proposed concealment method supports both raster scan and FMO type slices. Performance evaluations show that our approach achieves significant improvement over existing methods in both PSNR and subjective picture quality.

» View citation and abstract

IEEE Members

Log in by entering your IEEE Web Account Username and Password.

IEEE Communications Society members: If you subscribe to the IEEE Electronic Periodicals Package or IEEE Electronic Periodicals Package Plus, you must access your subscription at www.comsoc.org.

Users at Subscribing Institutions

Check with your librarian, information professional, or system manager to determine if you need to log in. Please complete the online Technical Support Form if you need assistance.

Already Purchased This Article?

Select the Purchase History link to access the document. You will have 5 Days after purchase to access the Full Text PDF. Please complete the online Technical Support Form if you need assistance.

Guests

• Search and access Abstract records free of charge
Register for table of contents alerts
• Purchase Full Text PDF documents

» Learn more about subscription options or how to become an IEEE Member.

You are not logged in.
LOGIN
Username
Password
GO
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Learn more about IEEE Subscriptions
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved