IEEE Xplore - Login

Cart | Sitemap | Help

Login


	BROWSE	SEARCH	IEEE XPLORE GUIDE	SUPPORT


Article Information

A photo-thermoelectric technique for anisotropic thermal diffusivity characterization of nanowire/nanotube composites Borca-Tasciuc, T.; Borca-Tasciuc, D.-A.; Gang Chen Semiconductor Thermal Measurement and Management Symposium, 2005 IEEE Twenty First Annual IEEE Volume , Issue , 15-17 March 2005 Page(s): 283 - 291 Digital Object Identifier 10.1109/STHERM.2005.1412193 Summary: Thermal properties of nanowire and nanotube arrays and their composites formed by deposition in a nanochannel alumina matrix have attracted a great research interest due to possible applications in high efficiency thermoelectric energy conversion and thermal management. A photo-thermoelectric technique was employed recently to perform anisotropic thermal diffusivity measurements in aligned carbon nanotube arrays, nanochannel alumina, and Bi and BiTe nanowire alumina composites. In this technique a thermal wave is produced into the specimen by absorption of laser radiation while the thermal wave is detected using a fast thermoelectric effect at the junction between a sharp wire probe and the sample surface. To allow effective heating and signal detection, additional thin-film layers may need to be deposited onto the samples. However, heat transport through the layers and the thermoelectric probe may affect the thermal transport measurements. This work discusses a heat conduction model that takes these effects into account and can be used to guide the selection of the probe and thin-film materials and thicknesses such that the accuracy of the thermal measurements is minimally affected. The discussion is illustrated with simulation results, calibration experiments, and examples of anisotropic thermal diffusivity characterization in aligned multiwall carbon nanotube arrays. » View citation and abstract



IEEE Members

Log in by entering your IEEE Web Account Username and Password. IEEE Communications Society members: If you subscribe to the IEEE Electronic Periodicals Package or IEEE Electronic Periodicals Package Plus, you must access your subscription at www.comsoc.org.



Users at Subscribing Institutions

Check with your librarian, information professional, or system manager to determine if you need to log in. Please complete the online Technical Support Form if you need assistance.



Already Purchased This Article?

Select the Purchase History link to access the document. You will have 5 Days after purchase to access the Full Text PDF. Please complete the online Technical Support Form if you need assistance.



Guests

• Search and access Abstract records free of charge • Register for table of contents alerts • Purchase Full Text PDF documents » Learn more about subscription options or how to become an IEEE Member.

You are not logged in.

Username

Password

» Forgot your password?

Please remember to log out when you have finished your session.

You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML

Access this document

» Buy this document now

» Learn more about

subscription options

» Learn more about

purchasing articles

and standards

Learn more about IEEE Subscriptions

Help Contact Us Privacy & Security IEEE.org