Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Login
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
Article Information

Self-tuning speculation for maintaining the consistency of client-cached data

Keqiang Wu; Lilja, Dj.
Parallel and Distributed Systems, 2004. ICPADS 2004. Proceedings. Tenth International Conference on
Volume , Issue , 7-9 July 2004 Page(s): 91 - 100
Digital Object Identifier   10.1109/ICPADS.2004.1316084
Summary: This paper presents a new protocol, self-tuning active data-aware cache consistency (SADCC), which employs parallel communication and self-tuning speculation to improve the performance of data-shipping database systems. Using parallel communication with simultaneous client-server and client-client communication, SADCC reduces the network latency for detecting data conflicts by 50%, while increasing message volume overhead by only about 4.8%. By being aware of the global states of cached data, clients self-tune between optimistic and pessimistic consistency control. The abort rate is reduced by statistically quantifying the speculation cost. We compare SADCC with the leading cache consistency algorithms, active data-aware cache consistency (ADCC) and asynchronous avoidance-based cache consistency (AACC), in a page server DBMS architecture with page-level consistency. The experiments show that, in a non-contention environment, both SADCC and ADCC display a slight reduction (an average of 2.3%) in performance compared to AACC with a high-speed network environment. With high contention, however, SADCC has an average of 14% higher throughput than AACC and 6% higher throughput than ADCC.

» View citation and abstract

IEEE Members

Log in by entering your IEEE Web Account Username and Password.

IEEE Communications Society members: If you subscribe to the IEEE Electronic Periodicals Package or IEEE Electronic Periodicals Package Plus, you must access your subscription at www.comsoc.org.

Users at Subscribing Institutions

Check with your librarian, information professional, or system manager to determine if you need to log in. Please complete the online Technical Support Form if you need assistance.

Already Purchased This Article?

Select the Purchase History link to access the document. You will have 5 Days after purchase to access the Full Text PDF. Please complete the online Technical Support Form if you need assistance.

Guests

• Search and access Abstract records free of charge
Register for table of contents alerts
• Purchase Full Text PDF documents

» Learn more about subscription options or how to become an IEEE Member.

You are not logged in.
LOGIN
Username
Password
GO
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Learn more about IEEE Subscriptions
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved