IEEE Xplore - Login

Cart | Sitemap | Help

Login


	BROWSE	SEARCH	IEEE XPLORE GUIDE	SUPPORT


Article Information

Fast contour matching using approximate earth moverapos;s distance Grauman, K.; Darrell, T. Computer Vision and Pattern Recognition, 2004. CVPR 2004. Proceedings of the 2004 IEEE Computer Society Conference on Volume 1, Issue , 27 June-2 July 2004 Page(s): I-220 - I-227 Vol.1 Digital Object Identifier 10.1109/CVPR.2004.1315035 Summary: Weighted graph matching is a good way to align a pair of shapes represented by a set of descriptive local features; the set of correspondences produced by the minimum cost matching between two shapes' features often reveals how similar the shapes are. However due to the complexity of computing the exact minimum cost matching, previous algorithms could only run efficiently when using a limited number of features per shape, and could not scale to perform retrievals from large databases. We present a contour matching algorithm that quickly computes the minimum weight matching between sets of descriptive local features using a recently introduced low-distortion embedding of the earth mover's distance (EMD) into a normed space. Given a novel embedded contour, the nearest neighbors in a database of embedded contours are retrieved in sublinear time via approximate nearest neighbors search with locality-sensitive hashing (LSH). We demonstrate our shape matching method on a database of 136,500 images of human figures. Our method achieves a speedup of four orders of magnitude over the exact method, at the cost of only a 4% reduction in accuracy. » View citation and abstract



IEEE Members

Log in by entering your IEEE Web Account Username and Password. IEEE Communications Society members: If you subscribe to the IEEE Electronic Periodicals Package or IEEE Electronic Periodicals Package Plus, you must access your subscription at www.comsoc.org.



Users at Subscribing Institutions

Check with your librarian, information professional, or system manager to determine if you need to log in. Please complete the online Technical Support Form if you need assistance.



Already Purchased This Article?

Select the Purchase History link to access the document. You will have 5 Days after purchase to access the Full Text PDF. Please complete the online Technical Support Form if you need assistance.



Guests

• Search and access Abstract records free of charge • Register for table of contents alerts • Purchase Full Text PDF documents » Learn more about subscription options or how to become an IEEE Member.

You are not logged in.

Username

Password

» Forgot your password?

Please remember to log out when you have finished your session.

You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML

Access this document

» Buy this document now

» Learn more about

subscription options

» Learn more about

purchasing articles

and standards

Learn more about IEEE Subscriptions

Help Contact Us Privacy & Security IEEE.org