IEEE Xplore - Login

Cart | Sitemap | Help

Login


	BROWSE	SEARCH	IEEE XPLORE GUIDE	SUPPORT


Article Information

Software effort estimation using machine learning methods Baskeles, B.; Turhan, B.; Bener, A. Computer and information sciences, 2007. iscis 2007. 22nd international symposium on Volume , Issue , 7-9 Nov. 2007 Page(s):1 - 6 Digital Object Identifier 10.1109/ISCIS.2007.4456863 Summary:In software engineering, the main aim is to develop projects that produce the desired results within limited schedule and budget. The most important factor affecting the budget of a project is the effort. Therefore, estimating effort is crucial because hiring people more than needed leads to a loss of income and hiring people less than needed leads to an extension of schedule. The main objective of this research is making an analysis of software effort estimation to overcome problems related to it: budget and schedule extension. To accomplish this, we propose a model that uses machine learning methods. We evaluate these models on public datasets and data gathered from software organizations in Turkey. It is found out in the experiments that the best method for a dataset may change and this proves the point that the usage of one model cannot always produce the best results. » View citation and abstract



IEEE Members

Log in by entering your IEEE Web Account Username and Password. IEEE Communications Society members: If you subscribe to the IEEE Electronic Periodicals Package or IEEE Electronic Periodicals Package Plus, you must access your subscription at www.comsoc.org.



Users at Subscribing Institutions

Check with your librarian, information professional, or system manager to determine if you need to log in. Please complete the online Technical Support Form if you need assistance.



Already Purchased This Article?

Select the Purchase History link to access the document. You will have 5 Days after purchase to access the Full Text PDF. Please complete the online Technical Support Form if you need assistance.



Guests

• Search and access Abstract records free of charge • Register for table of contents alerts • Purchase Full Text PDF documents » Learn more about subscription options or how to become an IEEE Member.

You are not logged in.

Username

Password

» Forgot your password?

Please remember to log out when you have finished your session.

You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML

Access this document

» Buy this document now

» Learn more about

subscription options

» Learn more about

purchasing articles

and standards

Learn more about IEEE Subscriptions

Help Contact Us Privacy & Security IEEE.org