IEEE Xplore - Login

Cart | Sitemap | Help

Login


	BROWSE	SEARCH	IEEE XPLORE GUIDE	SUPPORT


Article Information

An MPSoC Performance Estimation Framework Using Transaction Level Modeling Ben, R.A.; Niar, S.; Meftali, S.; Dekeyser, J.-L. Embedded and Real-Time Computing Systems and Applications, 2007. RTCSA 2007. 13th IEEE International Conference on Volume , Issue , 21-24 Aug. 2007 Page(s):525 - 533 Digital Object Identifier 10.1109/RTCSA.2007.21 Summary:To use the tremendous hardware resources available in next generation multiprocessor systems-on-chip (MPSoC) efficiently, rapid and accurate design space exploration (DSE) methods are needed to evaluate the different design alternatives. In this paper, we present a framework that makes fast simulation and performance evaluation of MPSoC possible early in the design flow, thus reducing the time-to-market. In this framework and within the transaction level modeling (TLM) approach, we present a new definition of the timed programmer's view (PVT) level by introducing two complementary modeling sublevels. The first one, PVT transaction accurate (PVT-TA), offers a high simulation speedup factor over the cycle accurate bit accurate (CABA) level modeling. The second one, PVT event accurate (PVT-EA), provides a better accuracy with a still acceptable speedup factor. An MPSoC platform has been developed using these two sublevels including performance estimation models. Simulation results show that the combination of these two sublevels gives a high simulation speedup factor of up to 18 with a negligible performance estimation error margin. » View citation and abstract



IEEE Members

Log in by entering your IEEE Web Account Username and Password. IEEE Communications Society members: If you subscribe to the IEEE Electronic Periodicals Package or IEEE Electronic Periodicals Package Plus, you must access your subscription at www.comsoc.org.



Users at Subscribing Institutions

Check with your librarian, information professional, or system manager to determine if you need to log in. Please complete the online Technical Support Form if you need assistance.



Already Purchased This Article?

Select the Purchase History link to access the document. You will have 5 Days after purchase to access the Full Text PDF. Please complete the online Technical Support Form if you need assistance.



Guests

• Search and access Abstract records free of charge • Register for table of contents alerts • Purchase Full Text PDF documents » Learn more about subscription options or how to become an IEEE Member.

You are not logged in.

Username

Password

» Forgot your password?

Please remember to log out when you have finished your session.

You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML

Access this document

» Buy this document now

» Learn more about

subscription options

» Learn more about

purchasing articles

and standards

Learn more about IEEE Subscriptions

Help Contact Us Privacy & Security IEEE.org