Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Login
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
Article Information

Atmospheric multiple scattering effects on GLAS altimetry. I.Calculations of single pulse bias

Duda, D.P.; Spinhirne, J.D.; Eloranta, E.W.
Geoscience and Remote Sensing, IEEE Transactions on
Volume 39, Issue 1, Jan 2001 Page(s):92 - 101
Digital Object Identifier   10.1109/36.898668
Summary:Estimates of the effect of pulse stretching on satellite laser altimetry, such as planned for the Geoscience Laser Altimeter System (GLAS), by cloud multiple scattering were made from an analytical method and with Monte Carlo simulations. Altimetry is dependent on the time required for a laser pulse to complete the roundtrip to the surface and return to the transmitter. Since a transmitted Gaussian pulse will be stretched by the effects of multiple scattering, the use of the pulse centroid as the receive time will produce a biased measurement or an apparent delay in the receive time. The magnitude of this delay was found to be dependent on several factors including cloud height, cloud optical depth, cloud particle size, particle shape, and receiver field of view. The delay was found to be largest for low-level clouds with particle radii of 3-20 μm, potentially amounting to altimetry biases of tens of cm. Alternate methods for measuring the receive time, such as a simple Gaussian fit of the return pulse peak reduce the path delay estimates for all cloud conditions. Since GLAS is a dual mode instrument that includes an atmospheric lidar channel, altimeter measurements that are likely to be significantly contaminated by multiple scattering can be identified

» View citation and abstract

IEEE Members

Log in by entering your IEEE Web Account Username and Password.

IEEE Communications Society members: If you subscribe to the IEEE Electronic Periodicals Package or IEEE Electronic Periodicals Package Plus, you must access your subscription at www.comsoc.org.

Users at Subscribing Institutions

Check with your librarian, information professional, or system manager to determine if you need to log in. Please complete the online Technical Support Form if you need assistance.

Already Purchased This Article?

Select the Purchase History link to access the document. You will have 5 Days after purchase to access the Full Text PDF. Please complete the online Technical Support Form if you need assistance.

Guests

• Search and access Abstract records free of charge
Register for table of contents alerts
• Purchase Full Text PDF documents

» Learn more about subscription options or how to become an IEEE Member.

You are not logged in.
LOGIN
Username
Password
GO
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Learn more about IEEE Subscriptions
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved