| 4-1995 |
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Active - IEEE Std 4-1995 (revision Of IEEE Std 4-1 978) IEEE Standard Techniques For High-voltage Testing
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| 4a-2001 |
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Active - Amendment to IEEE standard techniques for high-voltage testing
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| 62-1995 |
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Active - IEEE guide for diagnostic field testing of electric power apparatus
- part 1: oil filled power transformers, regulators, and reactors
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| 81-1983 |
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Active - IEEE guide for measuring earth resistivity, ground impedance, and earth surface potentials of a ground system
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| 120-1989 |
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Active - IEEE master test guide for electrical measurements in power
circuits
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| 181-2003 |
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Active - IEEE standard on transitions, pulses, and related waveforms
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| 260.1-2004 |
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Active - IEEE Standard Letter Symbols for Units of Measurement (SI Units, Customary Inch-Pound Units, and Certain Other Units)
Revision of 260.1-1993
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| 260.3-1993 |
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Active - American National Standard mathematical signs and symbols for use in physical sciences and technolog
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| 260.4-1996 |
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Active - American National Standard letter symbols and abbreviations for
quantities used in acoustics
Reaffirmed 2002, 2004
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| 270-2006 |
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Active - IEEE Standard Definitions for Selected Quantities, Units, and Related Terms, with Special Attention to the International System of Units (SI)
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| 287-2007 |
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Active - IEEE Standard for Precision Coaxial Connectors (DC to 110 GHz)
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| 315-1975 |
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Active - Graphic Symbols for Electrical and Electronics Diagrams (Including Reference Designation Letters)
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| 488.1-2003 |
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Active - IEEE standard for higher performance protocol for the standard digital interface for programmable instrumentation
Reaffirmed 2009 Replaced by 60488-1-2004
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| 716-1995 |
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Active - Standard Test Language for All Systems - Common/Abbreviated Test Language for All Systems (C/ATLAS)
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| 771-1998 |
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Active - IEEE guide to the use of the ATLAS specification
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| 91a-1991 |
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Active - Graphic symbols for logic functions
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| 91a-1991 |
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Active - Graphic symbols for logic functions (includes IEEE Std 91a-1991
supplement, and IEEE STd 91-1984)
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| 945-1984 |
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Active - IEEE recommended practice for preferred metric units for use in electrical and electronics science and technology
Reaffirmed 1992, 1997, 2002,2008
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| 991-1986 |
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Active - IEEE standard for logic circuit diagrams. Corrected edition
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| 993-1997 |
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Active - IEEE standard for Test Equipment Description Language (TEDL)
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| 1057-2007 |
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Active - IEEE Standard for Digitizing Waveform Recorders
Revision of 1057-1994
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| 1122-1998 |
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Active - IEEE standard for digital recorders for measurements in high voltage impulse tests
Reaffirmed 2007
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| 1139-2008 |
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Active - IEEE standard for broadband over power line hardware
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| 1149.1-2001 |
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Active - IEEE standard test access port and boundary-scan architecture
Reaffirmed 2008
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| 1149.4-1999 |
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Active - IEEE standard for a mixed-signal test bus
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| P1149.4/D14, Apr 2009 |
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Active Unapproved Draft - Standard for a Mixed-Signal Test Bus
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| 1149.6-2003 |
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Active - IEEE Std. 1149.6
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| 1174-2000 |
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Active - IEEE standard serial interface for programmable instrumentation
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| 1193-2003 |
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Active - IEEE Std 1193 - 2003 - (Revision of IEEE Std 1193 - 1994) - IEEE Guide for Measurement of Environmental Sensitivities of Standard Frequency Generators
Revision of 1193-1994
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| 1226-1998 |
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Active - IEEE trial-use standard for A Broad Based Environment for Test
(ABBET), overview and architecture
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| 1226.3-1998 |
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Active - IEEE standard for software interface for resource management for A
Broad-Based Environment for Test (ABBET)
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| 1232.1-1997 |
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Active - IEEE trial-use standard for Artificial Intelligence Exchange and
Service Tie to All Test Environments (AI-ESTATE): data and knowledge
specification
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| 1232.2-1998 |
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Active - IEEE trial-use standard for Artificial Intelligence Exchange and
Service Tie to All Test Environments (AI-ESTATE): service specification
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| P1232/D4, Jan 2009 |
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Active Unapproved Draft - IEEE Draft Standard for Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE)
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| 1241-2000 |
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Active - IEEE standard for terminology and test methods for
analog-to-digital converters
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| P1241/D6.6, Aug 2009 |
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Active Unapproved Draft - Draft IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters
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| P1241/D6.8, Oct 2009 |
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Active Unapproved Draft - Draft IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters
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| 1332-1998 |
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Active - IEEE standard reliability program for the development and
production of electronic systems and equipment
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| 1413-1998 |
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Active - IEEE standard methodology for reliability prediction and assessment
for electronic systems and equipment
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| 1413.1-2002 |
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Active - IEEE Std 1413.1 - 2002
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| 1445-1998 |
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Active - IEEE standard for Digital Test Interchange Format (DTIF)
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| 1450.1-2005 |
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Active - IEEE Std. 1450.1 - 2005 IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450 /sup TM/ 1999) for Semiconductor Design Environments
An Errata is available
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| 1450.3-2007 |
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Active - IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for Tester Target Specification
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| 1450.6-2005 |
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Active - IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data-Core Test Language (CTL)
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| 1450.6.1-2009 |
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Active - IEEE Standard for Describing On-Chip Scan Compression
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| 1451.0-2007 |
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Active - IEEE Standard for a Smart Transducer Interface for Sensors and Actuators - Common Functions, Communication Protocols, and Transducer Electronic Data Sheet (TEDS) Formats
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| 1451.2-1997 |
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Active - IEEE standard for a smart transducer interface for sensors and
actuators - transducer to microprocessor communication protocols and
Transducer Electronic Data Sheet (TEDS) formats
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| 1451.3-2003 |
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Active - IEEE Standard for a Smart Transducer Interface for Sensors and Actuators-Digital Communication and Transducer Electronic Data Sheet (TEDS) Formats for Distributed Multidrop Systems
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| 1451.4-2004 |
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Active - IEEE Standard for A Smart Transducer Interface for Sensors and Actuators - Mixed-Mode Communication Protocols and Transducer Electronic Data Sheet (TEDS) Formats
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| 1451.5-2007 |
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Active - IEEE Standard for a Smart Transducer Interface for Sensors and Actuators¿ Wireless Communication Protocols and Transducer Electronic Data Sheet (TEDS) Formats
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| P1451.7/D1.01, Jan 2009 |
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Active Unapproved Draft - IEEE Standard for a Smart Transducer Interface for Sensors and Actuators - Transducers to Radio Frequency Identification (RFID) Systems Communication Protocols and Transducer Electronic Data Sheet Formats
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| P1451.7/D1.1, May 2009 |
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Active Unapproved Draft - IEEE Draft Standard for a Smart Transducer Interface for Sensors and Actuators - Transducers to Radio Frequency Identification (RFID) Systems Communication Protocols and Transducer Electronic Data Sheet Formats
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| 1459-2000 |
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Active - IEEE Trial-Use Standard Definitions for the Measurement of Electric Power Quantities Under Sinusoidal, Nonsinusoidal, Balanced, or Unbalanced Conditions
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| P1459/D5, Aug 2009 |
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Active Unapproved Draft - Draft Standard Definitions for the Measurement of Electric Power Quantities Under Sinusoidal, Non-Sinusoidal, Balanced, or Unbalanced Conditions
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| P1459/D6 Oct 2009 |
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Active Unapproved Draft - Draft Standard Definitions for the Measurement of Electric Power Quantities Under Sinusoidal, Non-Sinusoidal, Balanced, or Unbalanced Conditions
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| 1505-2006 |
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Active - IEEE Standard for Receiver Fixture Interface
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| 1505.1-2008 |
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Active - IEEE trial-use standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505¿
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| P1505/D6, Oct 2009 |
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Active Unapproved Draft - Draft Standard for Standard for Receiver Fixture Interface
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| 1522-2004 |
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Active - IEEE Trial-Use Standard for Testability and Diagnosability Characteristics and Metrics
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| 1532-2002 |
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Active - IEEE Standard for In-System Configuration of Programmable Devices
Revision of 1532-2001
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| 1541-2002 |
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Active - IEEE Standard for Prefixes for Binary Multiples
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| 1546-2000 |
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Active - IEEE guide for digital test interchange format (DTIF) application
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| 1588-2008 |
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Active - IEEE Standard for a Precision Clock Synchronization Protocol for Networked Measurement and Control Systems
An interpretation is available
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| P1601/D10, Mar 2008 |
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Active Unapproved Draft - Draft Trial-Use Standard for Optical A.C. Current and Voltage Sensing Systems
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| 1636-2009 |
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Active - IEEE trial-use standard for software interface for maintenance information collection and analysis (SIMICA)
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| 1636.1-2007 |
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Active - IEEE Trial-Use Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA): Exchanging Test Results and Session Information via the eXtensible Markup Language (XML)
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| P1636.1/D3, Jan 09 |
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Active Unapproved Draft - IEEE Draft Trial-Use Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA): Exchanging Test Results and Session Information via the eXtensible Markup Language (XML)
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| P1636.2/D3, Aug 2008 |
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Active Unapproved Draft - Draft Trial-Use Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA): Exchanging Maintenance Action Information (MAI) via the Extensible Markup Language (XML)
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| 1641.1-2006 |
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Active - IEEE Guide for the Use of IEEE Std 1641, Standard for Signal and Test Definition
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| P1641/D3, Sept 2009 |
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Active Unapproved Draft - Draft Standard for Signal and Test Definition
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| 1650-2005 |
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Active - IEEE Standard Test Methods for Measurement of Electrical Properties of Carbon Nanotubes
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| 1671-2006 |
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Active - IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML
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| 1671.2-2008 |
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Active - IEEE trial-use standard for automatic test markup language (ATML) for exchanging automatic test equipment and test information via XML: exchanging instrument descriptions
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| 1671.3-2007 |
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Active - IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via eXtensible Markup Language (XML): Exchanging Unit Under Test (UUT) Description Information
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| 1671.4-2007 |
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Active - IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via eXtensible Markup Language (XML): Exchanging Test Configuration Information
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| 1671.5-2008 |
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Active - IEEE trial-use standard for automatic test markup language (ATML) for exchanging automatic test information via XML: exchanging test adapter information
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| 1671.6-2008 |
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Active - IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML: Exchanging Test Station Information
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| 1783-2009 |
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Active - IEEE Guide for Test Methods and Procedures to Evaluate the Electrical Performance of Insulators in Freezing Conditions
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| 60488-1-2004 |
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Active - Higher performance protocol for the standard digital interface for programmable instrumentation - Part 1: General
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| 60488-2-2004 |
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Active - Standard digital interface for programmable instrumentation - Part 2: Codes, formats, protocols and common commands
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| IEC 62243 First edition 2005-07 |
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Active - Artificial intelligence exchange and service tie to all test environments (AI-ESTATE)
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| IEC 62525-Edition 1.0 - 2007 |
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Active - Standard Test Interface Language (STIL) for Digital Test Vector Data
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| IEC 62525:2007 (E), IEEE 1450-2007 |
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Active - Standard Test Inerface Language (STIL) for Digital Test Vector Data
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| IEC 62526 edition 1.0 2007 |
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Active - Standard for extensions to standard test interface language (STIL) for semiconductor design environments
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| IEC 62527:2007 (E), IEEE Std 1450.2-2007 |
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Active - Standard for Extensions to Standard Test Interface Language (STIL) for DC Level Specification
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| IEC 62528:2007 (E), IEEE Std 1500-2007 |
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Active - Standard Testability Method for Embedded Core-based Integrated Circuits
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| IEC 62529:2007 (E), IEEE Std 1641-2007 |
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Active - Standard for Signal and Test Definition
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| C37.2-2008 |
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Active - IEEE Standard for Electrical Power System Device Function Numbers, Acronyms, and Contact Designations
Revision of C37.2-1996
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| SI10-2002 |
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Active - IEEE/ASTM SI 10 - 2002
An Errata is available Revision of IEEE/ASTM SI 10-1997
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| Y32.9-1972 |
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Active - American National Standard graphic symbols for electrical wiring and layout diagrams used in architecture and building construction
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